Horticultural Studies (HortiS) 2018, Vol 35, Num, 2     (Pages: 194-200)

Evaluation of some chickpea lines and cultivars for yield and yield components

Hüseyin GÜNGÖR 1 ,Ziya DUMLUPINAR 2

1 Düzce Üniversitesi Ziraat ve Doğa Bilimleri Fakültesi Tarla Bitkileri Bölümü, Düzce
2 Kahramanmaraş Sütçü İmam Üniversitesi Ziraat Fakültesi Tarımsal Biyoteknoloji Bölümü, Kahramanmaraş
DOI : 10.16882/derim.2018.444157 Viewed : 1553 - Downloaded : 789 This study was carried out under Kırklareli-Lüleburgaz conditions in 2015-2016 cropping season using 36 chickpea lines and 24 commercial cultivars and was arranged in an augmented experiment design. The genotypes were found variable for all investigated traits. The average seed yield was 107.8 kg da-1 in commercial cultivars while 150.3 kg da-1 in lines. The highest seed yield among cultivars was obtained from cv. Azkan with 160 kg da-1 while Akçin-91 was the lowest with 56.4 kg da-1. The line SMN 13 had the highest seed yield (254.2 kg da-1) and was 58% higher than cv. Azkan and was found hopeful for the region. The highest 100 seed weight was obtained from SMN 02 (45.3 g), the highest seed number was obtained from SMN 13 (45.3 seeds per plant), the highest pod number was obtained from SMN 17 (47.3 pods per plant) and the highest total branch number was obtained from SMN 82 (15.7 numbers per plant). According to the biplot analysis PC1 and PC1 (34.9 and 22.0%, respectively) were explained the 56.9% of the total variation. First pod height, plant height, branch number, 100 seed weight, seed number, pod number and seed yield were positive traits while flowering time and physiological maturity was the negative traits. Çağatay, Er-99, Azkan, Eser-87, Aziziye-94, Akça, SMN 60 and Aksu were the most stable genotypes while, Aydın-92, Cevdetbey 98 and Diyar-95 has higher values for plant height, first pod height and total branch number. The genotypes SMN 13 and SMN 17 had higher seed yield (kg da-1), pod number and seed number per plant. Keywords : Chickpea; Cicer arietinum; Line; Yield; Yield components; Biplot